Thyristor & Diode Testing Services

Reliable post-fabrication testing for silicon power devices — modules, press-pack, stud

What We Offer

Comprehensive testing of thyristors and diodes — including static and dynamic parameters.
Device types supported: press-pack, stud-mounted, and module devices.
Test parameters: V_BR, I_GT, V_TM, I_R, Q_rr, t_q and more.
Custom test protocols based on your datasheets or application needs.
Post-production validation or requalification of devices from third-party fabs.
Batch-level reporting and sorting (binning) services available.

Why Choose Us

In-house capability to handle high-current and high-voltage measurements.
Fast turnaround for prototype and small-to-mid volume production lots.
Engineering support for failure analysis and parameter interpretation.
Confidentiality guaranteed for all third-party device testing.

Get in Touch

To request a quote or discuss your test needs, please contact our applications team. We can accommodate your wafers, bare dies, or packaged devices for analysis and reporting.